Tips, Tricks, and Traps for On-Wafer Probing FREE Presentation will begin on January 28, 2010 at 2pm EST.

Test engineers often need to perform various on-wafer measurements using semi-automatic probers. It is often difficult to achieve accurate measurements due to problems in the interconnect between the test equipment and the prober. This seminar will show the best practices for on-wafer probing and how to identify and solve common problems.

Participant Objectives
Those participating in this seminar will learn:

  • How to cable for accurate low current DC measurements
  • How to cable for accurate CV measurements
  • How to cable for ultra fast and pulse IV measurements
  • The benefits of using Keithley-supplied cables and accessories to perform DC, ultra fast, CV, and pulsed IV measurements
  • Proper grounding and guarding techniques
  • Selecting the proper types of interconnect cables
  • How to troubleshoot interconnect problems

Target Audience
This seminar is recommended for test engineers and test engineering managers who have a basic understanding of wafer probing. The content is appropriate for engineers working with on-wafer device

Request to Register for the FREE Tips, Tricks, and Traps for On-Wafer Probing