Keithley Expands its Series 2600 line

The Models 2635 and 2636 represent a new and unique way of doing parametric analysis at resolutions as fine as 1fa (10^-15 amp), which is often required for many semiconductor, optoelectronic, and nanotechnology devices.Moreover, their instrument-based, multi-channel architecture results in a 50 percent lower cost than typical mainframe-based source-measure solutions.

Features and Benefits:

• Easy Scalability for Lowest Cost of Ownership
• The Models 2635 and 2636 operate as five precision instruments in a single box: SMU (source-measure unit), DMM (digital multimeter), bias source, low frequency pulse generator, and arbitrary waveform generator.
• TSP-Link master/slave connection provides a high-speed, low-latency interface to other TSP-based instruments
• two free software tools that greatly simplify systemization of the Series 2600 SourceMeter Instruments:
  • Keithley's LabTracer™ 2.0
  • Test Script Processor

Series 2600 instruments enable scalable source-measure channel counts and high-speed testing for a variety of semiconductor test applications including wafer level reliability, on-wafer parametric die sort, and automated characterization.

Click here for more information about the Series 2600 SourceMeter Instruments.

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