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Keithley 4200-SCS Semiconductor Characterization
New Product: Keithley 4200-SCS Semiconductor Characterization
Posted: Saturday, July 21, 2012 Location: Cleveland, Ohio, USA
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- Make: Keithley Instruments
- Model: 4200-SCS
- Price: Contact Seller
- Description: Keithley Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm No [description truncated]
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