New Product: Rigaku NEX CG - Cartesian Geometry EDXRF

Cartesian geometry for trace level sensitivity

Energy Dispersive X-ray Fluorescence (EDXRF) analyzers for non-destructive elemental analysis of sodium (Na) through uranium (U) — in solids, liquids, powders and thin films — from parts-per-billion (ppb) levels to 100%. Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types—with minimal standards:

• Analyze 11Na to 92U non-destructively
• Solids, liquids, powders and thin films
• Polarized excitation for lower detection limits
• Novel treatment of peak overlap reduces errors
• PPB detection limits for aqueous samples using UltraCarry
• Simplified user interface with EZ Analysis

Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis even in difficult sample types.

Novel software reduces the need for standards

NEX CG is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards—and rigorous quantitative analysis with standards. Especially well suited to the semi­quantitative determination of elemental content in complete unknowns, the superior analytical power, flexibility and ease-of-use of the NEX CG add to its broad appeal for research, industrial and in-plant monitoring applications.