Lab Equipment > Microscopes > Microscopes > 20/20 XL™ Film Thickness Measurement Tool

Share:

New Product For Sale Listings New Product: 20/20 XL™ Film Thickness Measurement Tool

Posted: Saturday, August 18, 2012    Location: San Dimas, California, USA

Contact the Company
  • Company Name: CRAIC Technologies
  • Location: San Dimas, California, USA
  • Your Information: * required information
  • Additional Information:
  • Buying Interest:
  • Company Literature:

Ad Details - #442140
CRAIC Technologies - 20/20 XL™
  • Make: CRAIC Technologies
  • Model: 20/20 XL™
  • Price: Contact Seller Availability: In Stock
  • Description: CRAIC Technologies 20/20 XL™ Small Spot Film Thickness, UV Microscopy and Raman Microspectroscopy of Large Scale Devices ... Read More
Company's Information Phone Number: Sign In OR Register
CRAIC Technologies
LabX Member since September 2007.

CRAIC TechnologiesT is a leading developer of instruments for UV-visible-NIR microanalysis. Spectra and images even of samples less than a micron can be analyzed. CRAIC Technologies products include UV and NIR microscopes, UV-visible-NIR microspectrophotometers, instruments to measure thin film thickness and colorimetry on the microscopic scale, Raman microspectrometers, automation solutions, traceable standards and more. Specialized systems have been developed for a number of fields including vitrinite coal analysis, protein crystals, forensic and semiconductor metrology. Below are links for each class of product that we manufacture that give more information on the science, the technology, the instruments themselves and how they are used.
Hits: 57134 | Views: 1670

Ad Description

CRAIC Technologies 20/20 XL™
Small Spot Film Thickness, UV Microscopy and
Raman Microspectroscopy of Large Scale Devices

The 20/20 XL™ is a microspectrophotometer designed to non-destructively analyze microscopic areas of very large samples. This system offers the ability to measure the thickness of thin films in both transmission and reflectance. It also offers the ability to measure the Raman spectra of microscopic samples, along with Ultraviolet and Near Infrared microscopy of semiconductor and other types of samples. Due to its flexible design, which gives it the ability to analyze the largest samples, applications are numerous and include mapping thin film thickness of large devices, locating and identifying contaminants, measuring strain in silicon and much more. With the ability to spectrally analyze and image microscopic samples or microscopic areas on large devices, the 20/20 XL™ microspectrophotometer is the cutting-edge micro-analysis tool for manufacturing facilities.

Click Here For More Information

CRAIC Technologies is a LabX Sponsor.
Please visit their website at: http://www.microspectra.com


Other Items Available From This Seller... See All

308 Coal™ Vitrinite Reflectance Measurement System
Lightswitch By CRAIC™ Optical Multiplexer
CRAIC Elixir™ for Multi-Function Analysis
High Spatial Resolution Testing of OLED Displays
20/20 XL™ UV-visible-NIR microspectrophotometer.