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The AMRAY 1845 features a 3 axes stage motorization package (X, Y, and R) and an IR Chamberview System. This system has been upgraded to WinXP for digital image capture and networking. ...
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Ad LV28781932
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The AMRAY 1860 FE SEM features an 8” Auto Loadlock and Windows XP upgrade for digital image capture and networking. This system comes equipped with a 5 axes motorized stage and STS IR ...
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Ad LV28781942
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The AMRAY 1910 FE features a 3 axes stage motorization package (X, Y, and R), along with a 4” load lock for fast transfer of samples. Also, this system has been upgraded to WinXP for d ...
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Ad LV28781936
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The AMRAY 3200 variable pressure SEM allows for uncompromised examination of conventionally unfriendly SEM samples. Standard features include a Robinson BSE, large chamber size, and computer ...
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Ad LV28781939
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The AMRAY 3300 FE-SEM offers high resolution, high magnification imaging. This SEM has a large chamber and a 3 axes (X,Y, and R) motorized stage and has been upgraded to WinXP for digital im ...
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Ad LV28781934
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The ELIONIX 8900FE SEM is a unique system offering calibrated measurements in X, Y, and Z! This capability is made possible by 4 secondary electron detectors geometrically positioned around ...
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Ad LV28781933
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The Hitachi Model S-3200H Scanning Electron Microscope is designed for surface observation at high resolution in the fields of medicine, biology, electronics, new materials, and so on. This ...
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Ad LV28781937
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This Hitachi S-4200 FE-SEM is in excellent condition. The imaging capability is super, and the system has been refurbished with our X-Stream Imaging System, which allows for image capture an ...
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Ad LV28781935
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Ad LV28781930
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This JEOL JSM-5900 Low Vacuum SEM has been modified by STS to acquire and display the video signal through our X-Stream Imaging System. The SEM comes with an 8" chamber, 5 axis motorize ...
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Ad LV28781943
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The JEOL6300F SEM uses a field emission gun with cold cathode. The resolution is 1.5 nm in secondary electron imaging (SEI) and 3.0 nm in backscattered electron imaging (BEI) at 30 kV. The a ...
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Ad LV28781941
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The JEOL JSM-6340F features an in-lens secondary electron detector capable of offering a resolution of 2.5 nm at 1kV. Also included is our X-Stream Imaging System, with WinXP for image captu ...
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Ad LV28781940
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The JEOL JSM-840 is a multi-purpose SEM capable of acceleration voltages up to 40kV. The system has been under a service contract from JEOL USA its entire time. This SEM features an Orion di ...
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Ad LV28781946
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The LEO 435 Variable Pressure SEM offers high-performance with a resolution of 4 nm. Its 5 axis computer controlled stage is mounted in a specimen chamber measuring 300 x 265 x 190 mm. ...
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Ad LV28781945
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The Philips XL 30 is a conventional SEM with mouse-driven operation in a Windows environment. This system provides both secondary electron and backscattered electron imaging, along with an i ...
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Ad LV28781944
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The NEON 40 EsB combines the imaging and analytical capabilities of a high resolution FE-SEM, using the proven GEMINI lens design, with an advanced Canion FIB column. In addition, this Cross ...
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Ad LV28781931
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