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Semiconductor > Metrology and Inspection    (334 Ads Listed)
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Portable pH Probe on Cart6" X 4" flangeStainless Steel setupListing: 213428
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New and Unused VMR International Type VWRI 662 1759 pH Electrode VWR part number: 662-1759 BNC connector***Removal ONLY fee for this item: 25 (GBP) (Packing Skidding Crating are not included ...
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ACCENT BIO-RAD Q5 REGISTRATION SYSTEM consisting of: - New Arrival, details coming soon!
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ACCENT BIO-RAD Q8 REGISTRATION TOOL consisting of: - Model: Q8 - Control Unit - Fully Robotic with Random Access, Pick and Place - Wafer Stage for 8"/200mm Wafer Size - 2 Cassette User Prog ...
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ADE 9500 ULTRA GUAGE MULTIMEASUREMENT SYSTEM consisting of: - Model: ADE 9500 Main System- Wafer Size Capable: 4" to 8" Wafer Diameter - ACS 2000 Controller - Manual Load (Elevators can be a ...
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CASCADE ALESSI REL-4800 MANUAL PROBE STATION consisting of: - Model: REL-4800- 8" Manual Probe Station - 8" Temperature Controlled Vacuum Chuck- Temptronic Temperature Controller (ID: 3583) ...
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KLA-TENCOR 2135 SURFACE INSPECTION SYSTEM consisting of: - KLA-Tencor 2135 Mainframe- Current Wafer Size: 200mm- SECS II/GEM Communication Interface- Pentium CPU with Windows NT Installed- N ...
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KLA-TENCOR 2401 VIPER MACRO DEFECT INSPECTION SYSTEM consisting of: - Model: 2401 Viper- Macro Defect Inspection System- System Computer- ORB 2.2 Gb Zip Drive- Flat Panel Touch Screen Contr ...
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KLA-TENCOR 5200XP OVERLAY REGISTRATION SYSTEM consisting of: - Model: 5200XP - Overlay Registration System - 8"/200mm Wafer Capable System- Fully Automated Non-Contact Box-In-Box Measuremen ...
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KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Do ...
Ad LV28997673
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KLA-TENCOR AIT II PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- Dual Open Cassette Handler Configuration- Software Version 5.3.17.4- Double Da ...
Ad LV28997675
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KLA-TENCOR AIT II PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- Single Open Cassette Handler Configuration- Software Version 5.3.17.4- Double ...
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KLA-TENCOR AIT UV DARKFIELD DEFECT INSPECTION SYSTEM consisting of: - Model: AIT-UV Mainframe- Darkfield Defect Inspection System- Current setup: 8"/200mm Wafers- Can be configured to proces ...
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KLA-TENCOR AIT XUV DARKFIELD DEFECT INSPECTION SYSTEM consisting of: - Model: AIT-XUV Mainframe- Darkfield Defect Inspection System- Configured with Articulating Dual Open Cassette Handler- ...
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KLA-TENCOR CRS-2000 OPTICAL DEFECT REVIEW SYSTEM consisting of: - Model: CRS-2000- Optical Defect Review System- Wafer Size: 200mm- Year of Manufacture: 1998- Serial Number: CRS2000-161
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KLA-TENCOR FLEXUS 5400 STRESS MEASUREMENT SYSTEM consisting of: - Model: 5400- Configured for 200mm Wafers- Single Cassette Station- Minimum Scan Step: 0.02mm- Maximum Points Per Scan: 1250- ...
Ad LV29115299
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KLA FLX-2320 STRESS MEASUREMENT SYSTEM consisting of: - Model: FLX-2320 (Flexus 2320)- Manual Wafer Load- Thin Film Stress Measurement System - Chuck Size: 8"/200mm - Temperature: up to 5 ...
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KLA-TENCOR HRP-200 PROFILER consisting of: - Model: HRP-200- Automated Surface Profilometer- Max Wafer Size: 8"/200mm- Open Cassette- Refurbished to Meet Original KLA-Tencor HRP-200 Specific ...
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KLA-TENCOR HRP-220 PROFILER consisting of: - Model: HRP-220- Upgraded from HRP-200 - Automated Surface Profilometer- Max Wafer Size: 8"/200mm- Open Cassette- Refurbished to Meet Original KLA ...
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KLA-TENCOR P-22 PROFILER consisting of: - Model: P-22 - Automated Surface Profilometer- Wafer Size: 8"/200mm - Automated Wafer Handler- 1 Open Loader for 200mm- Computer Controlled - Scan Me ...
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