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Metrology and Inspection Sponsors
New Products
Modular Design for Rapid Automation Development
Featuring automated high-speed XY stages,... Read More
Mitutoyo's new Digimatic Height Gage is excellent in both functionality and cost performance!
FEATU... Read More
Continuous Reflective Interface Sample Placement
Mounts onto any microscope’s stand... Read More
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KLA-TENCOR SURFSCAN 6200 SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: 6200 Surfscan - Bare Wafer Surface Defect Inspection System - Wafer Setup: 8/200mm- Defect Sensitivity: 0.12 ...
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Ad LV29356767
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KLA-TENCOR SURFSCAN 6220 DEFECT INSPECTION SYSTEM consisting of: - Model: Surfscan 6220 - Automatic Surface Inspection System- Bare wafer surface defect inspection system - Substrate/Sizes: ...
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Ad LV29356768
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KLA-TENCOR SURFSCAN 6420 DEFECT INSPECTION SYSTEM consisting of: - Model: Surfscan 6420- Bare wafer surface defect inspection system Substrate Size: - Wafer size capable: 100mm, 125mm, 150mm ...
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Ad LV29356769
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KLA-TENCOR UV-1050 THIN FILM MEASUREMENT SYSTEM consisting of:- Model: Prometrix UV-1050 - Wafer sizes: 100mm, 150mm, and 200mm- Thin film measurement tool - Broadband UV optics - Dual beam ...
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Ad LV29356728
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KLA-TENCOR UV-1080 THIN FILM MEASUREMENT SYSTEM consisting of: - Model: Prometrix UV-1080 - Max Wafer Capable: 200mm- Intel Pentium III Computer- Windows NT- Summit 2.62- 2 Open Cassette Sta ...
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Ad LV29356729
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KLA-TENCOR UV-1280SE THIN FILM MEASUREMENT SYSTEM consisting of: - Model: Prometrix UV-1280 SE - Max wafer capable: 200mm- Measures Film Thickness, Refractive Index (RI) and Extinction Coeff ...
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Ad LV29356730
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MICROVISION / ESI MVT 2080 INSPECTION MICROSCOPE consisting of: - Model: MVT 2080 Wafer Inspection Station - Leica INM-200 Microscope - Side mounted Open Cassette Load-ports w/ Bright Light ...
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Ad LV29356718
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MITUTOYO QUICK VISION QV202 DIE TILT MEASUREMENT SYSTEM consisting of: - Model: Quick Vision QV-202 - PRO6F - Non-Contact, CNC 3-D Vision Measuring Machine - SPC Software for Windows- Progra ...
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Ad LV29356771
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MTS NANO INDENTER SA2 consisting of: - Model: SA2- Control Unit- Computer- Main System- Acoustic Enclosure- Displacement Resolution: 0.0002 nm- Maximum Indentation Depth: >15 um- Loading ...
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Ad LV29356749
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NANOMETRICS NANOSPEC 3000 FILM THICKNESS MEASUREMENT SYSTEM consisting of: - Continuous Scanning from 400 - 800nm - Measurements as small as 100A up to 20um with a resolution of 50A - Measur ...
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Ad LV29356731
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NANOMETRICS NANOSPEC 4000 FILM THICKNESS MEASUREMENT SYSTEM consisting of: - Model: Nanospec 4000- Capable of accommodating wafers from 75mm to 200mm - Olympus 5x, 10x, and 50x objectives- O ...
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Ad LV29356732
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NANOMETRICS NANOSPEC 4150 THIN FILM THICKNESS MEASUREMENT SYSTEM consisting of: - Model: Nanospec 4150- Currently configured for 6"/150mm wafers- Capable of accommodating wafers from 75mm to ...
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Ad LV29356733
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NANOMETRICS NANOSPEC 8300 FILM THICKNESS MEASUREMENT SYSTEM consisting of: - Model: Nanospec 8300- Wafer Size: 200mm and 300mm wafers- Automatic film thickness measurement system- Thin film ...
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Ad LV29356734
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NIKON OPTIPHOT 200 INSPECTION MICROSCOPE consisting of: - Model: Optiphot 200- Wafer Inspection Microscope- Brightfield / Darkfield Illumination- Stage: 8" x 8" mechanical stage- Loader: Nid ...
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Ad LV29356719
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OLYMPUS BH2 / BHTU INSPECTION MICROSCOPE consisting of: - Model: BH2 / BHTU - Reflected and Transmitted Light (bottom side illumination)- Includes 3 Objective Lenses (all by Olympus): 1. A10 ...
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Ad LV29356720
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PLASMOS SD-4000 ELLIPSOMETER consisting of: - Model: SD4003- Automated Ellipsometer (thickness measurement system)- Up to 8"/200mm Wafer Capable- Automatic Wafer Handling - Leitz Camera and ...
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Ad LV29356735
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SOPRA GES-5 ELLIPSOMETER consisting of: - Model: GES-5- Spectroscopic Ellipsometer - 12" Vacuum Chuck- Allows for Variable-Angle Broadband Spectroscopic Ellipsometry- Covers a Spectral Range ...
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Ad LV29356736
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SUSS PM8 PROBE STATION consisting of:- Model: PM8- Manual Probe Station - Manufacturer: Suss MicroTec / Karl Suss- Configured for DC Probing- Vacuum Chuck: 8"/200mm Thermal Chuck- Optem Micr ...
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Ad LV29356773
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VEECO DEKTAK 3 PROFILER consisting of: - Dektak 3 Main System- Measures Step Height, Surface Roughness, Waviness and Curvature- Measures Step Heights from below 100 Angstroms to over 50 Micr ...
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Ad LV29356750
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VEECO DIMENSION 3000 AFM SYSTEM consisting of: - Model: Dimension 3000- Atomic Force Microscope (AFM)- Chuck: 6"/150mm Vacuum Chuck- XY Stage with Manual Positioning - Nanoscope IIIa Control ...
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Ad LV29356751
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