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Metrology and Inspection Sponsors
New Products
SZ-2000 Stereoscopic Zoom Microscope Automation
Based on ASI’s proven DC servo motor te... Read More
Mitutoyo's new Digimatic Height Gage is excellent in both functionality and cost performance!
FEATU... Read More
The FTP-2000 Focusing Translation Platform has been specifically designed to provide a high resol... Read More
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VEECO WYKO NT3300 OPTICAL PROFILER consisting of: - Model: NT3300 - Capable of handling up to 8"/200mm wafers - Non contact sub-micron Optical Profiler for 3D Surface Profilometry- 8 Auto XY ...
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Ad LV29356752
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Price: Request Price Quote
WENTWORTH MP2000 SEMI-AUTO PROBE STATION consisting of: - Model: MP2000- Semi-Auto Probe Station - 8/200mm Vacuum Chuck- Mitutoyo Microscope
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Ad LV29356774
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Price: Request Price Quote
WENTWORTH PML-8000 MANUAL PROBE STATION consisting of: - Model: PML-8000 - Manual Wafer Loading Probe Station- Vacuum Chuck: 8"/200mm - Mitutoyo Microscope- Manual Fine and Course X-Y Stage ...
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Ad LV29356775
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ZEISS AXIOPLAN 2 MICROSCOPE consisting of: - Model: Axioplan 2 Microscope- Reflected and transmitted modes - Bright field optics- Equipped with Fluorescence - Ludl Mac 5000 4"x 6" Automatic ...
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Ad LV29356721
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Price: Request Price Quote
ZEISS AXIOTRON 2 INSPECTION MICROSCOPE consisting of: - Model: Axiotron II Microscope - Manual focus- 200mm X 200mm (8"x8') wafer stage, manual drive- BF/DF Plan Apochromatic Objectives: 20X ...
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Ad LV29400062
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ZEISS AXIOTRON INSPECTION MICROSCOPE consisting of: - Model: Axiotron - Semiconductor Inspection Microscope- Reflected Light Microscope- Brightfield/Darkfield (BF/DF) Optics- DIC Nomarsky Op ...
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Ad LV29356727
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Price: Request Price Quote
ZEISS AXIOTRON INSPECTION MICROSCOPE consisting of: - Model: Axiotron - Semiconductor Inspection Microscope- Reflected Light Microscope- Brightfield/Darkfield (BF/DF) Optics- DIC Nomarsky Op ...
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Ad LV29356726
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Price: Request Price Quote
ZEISS AXIOTRON INSPECTION MICROSCOPE consisting of: - Model: Axiotron - Semiconductor Inspection Microscope- Reflected Light Microscope- Brightfield/Darkfield (BF/DF) Optics- DIC Nomarsky Op ...
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Ad LV29356725
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Price: Request Price Quote
ZEISS AXIOTRON INSPECTION MICROSCOPE consisting of: - Model: Axiotron- Brightfield/Darkfield (BF/DF) Optics- DIC Nomarsky Optics (Optional Upgrade at additional cost) - Objectives: EpiPlan N ...
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Ad LV29356724
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Price: Request Price Quote
ZEISS AXIOTRON INSPECTION MICROSCOPE consisting of: - Model: Axiotron- Brightfield/Darkfield (BF/DF) Optics- DIC Nomarsky Optics (Optional Upgrade at additional cost) - Objectives: EpiPlan-N ...
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Ad LV29356723
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Table top SEM Gold Sputtering System 6" Inner diameter Glass bell jar, Single target,Can be configured for single wafer or standard SEM samples, includes a Power supply Serial number 48 ...
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Ad LV29318228
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SEM Gold Sputtering System 6" diameter glass chamber with 1 3/4 SEM sample stage
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Ad LV28896592
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KLA UV1250SE thin film measurement and UV Spectrospoic Ellipsometry system. This system is the ultimate single-solution tool which simultaneously measure film thickness, refractive index, ex ...
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Ad LV28896611
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Model 4000 Surfscan
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Ad LV28567812
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Surface Contamination Analyser Model # 4500 Non-patterned wafer inspection capable of up to 6 wafers (150mm) Will Configure for 2 wafers capabilities, including 2 pan assembly, realignment, ...
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Ad LV28567803
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Surfscan Capable of up to 200mm wafers Currently configured for 200mm wafers with PA-172 cassettes Red light laser for Non-Patterned Surface Inspection System 0.15 micron Defect Sensitivity ...
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Ad LV28896616
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Surfscan Capable of up to 200mm wafers Currently configured for 200mm wafers with PA-172 cassettes Red light laser for Non-Patterned Surface Inspection System 0.15 micron Defect Sensitivity ...
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Ad LV28567810
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KLA 6220 Surfscan, Capable of 2" -8" wafers. Currently configured for 200mm wafers, PA-1182 Cassettes. Non-patterned surface Inspection System. 0.12 micron Defect Sensitivity @ 95% ...
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Ad LV28567800
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KLA 6420 Surfscan for Non-Patterned wafers, Capable of 3" -8" wafers, Low angle optics,Standard OEM puck,0.10 micron defect Sensitivity @ 95% capture on bare silicon, based on PSL standards, ...
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Ad LV28567884
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KLA 6420 Surfscan for Non-Patterned wafers, Capable of 3" -8" wafers, Low angle optics,Standard OEM puck,0.10 micron defect Sensitivity @ 95% capture on bare silicon, based on PSL ...
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Ad LV29318233
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