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Featured Microscopy Articles:
Most Exciting Time Since Abbe
Microscopy is evolving toward greater functionality and capabilities. The Auriga FIB SEM platform from Carl Zeiss (Thornwood, NY) has been around for 11 years yet undergoes constant improvement. The system combines two distinct technologies: scanning electron microscopy (SEM) and focused ion beam (FIB). SEM’s capability of providing very high-resolution surface analysis is well known in the life sciences, materials, and semiconductor industries. SEM provides detail significantly beyond the diffraction limit of light microscopy, illuminating structures and events down to about 1nm.
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Price: Call For Pricing
Optical Analysis Corp. Optical Box
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Ad LV29194562
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Price: Call For Pricing
Zeiss Axiovert 25 Inverted Phase Contrast Microscope.
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Ad LV29193735
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w/ abbe condenser 4x Objectives
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Ad LV28987767
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Compound phase contrast w/ condenser, objectives phase DM10, DM20, DM40 & DM100 oil. Objectives: 10x. 20x, 40x, 100x
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Ad LV28987772
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Binocular 10x Eyepeice
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Bausch & Lomb StereoZoom 4 / SZ4 Bausch & Lomb StereoZoom 4 / SZ4
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10x-70x w/ boomstand or regular
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Features: 10x WF Eyepieces Zoom Range 1x-7x Total Zoom 10x-70x
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Features: Boom Stand 10x WF Eyepieces Zoom Range 1x-7x Total Zoom 10x-70x
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Bio-Rad 583 Bio-Rad 583
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3 Shot color
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4.0 MP monochrome
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Xcite Series 120
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Hitachi S-4000 Hitachi S-4000
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Field Emission
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SEM 4"and 8" available.
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Hitachi S-6200H Hitachi S-6200H
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Hitachi S-6300V and S-6200 Hitachi S-6300V and S-6200
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CD SEMicroscope - 8". Upgraded S-9200
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Hoefer Scientific SE-540 Hoefer Scientific SE-540
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