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Semiconductor > Semiconductor Test    (190 Ads Listed)
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STANDARD STAGE, INCLUDES OPTICS AND PROBES AS SHOWN PHOTO Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for reference. Th ...
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Teledyne Tac SCT 1000 Substrate continuity tester includes computer, software flat screen and video camera. 6x6" travel. (12x12" system also available.) Click here to see a Demo of th ...
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Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for reference. There may be multiple models of this item in stock. JMI will email a v ...
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AlphaStep 200 Computerized Surface Profiler The AlphaStep 200 sets a new standard in computerized surface profiling-incorporating Tencor Instruments' latest innovations in profiling ...
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STYLUS PROFILOMETER FOR METAL THICKNESS MEASURMENT. Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for reference. There ma ...
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STYLES PROFILOMETER Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for reference. There may be multiple models of this ite ...
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WAFER DEFECT/CONTAMINATION SURFACE ANALYZER, DEFECT SIZE RANGE PROG. (1um2&255um2) Please note: JMI has thousands of machines in stock and the photo of the item taken at our facili ...
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TRIOTECH 203 BUBBLE TESTER GALLON CAPACITY DIGITAL READOUT Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for reference. ...
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TRIOTECH 481 BUBBLE TESTER 1/2 GALLON CAPACITY Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for reference. There may ...
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PROBES UP TO 200mm OR 8" WAFERS. AVAILABLE WITH STEREO ZOOM OPTICS OR HIGH POWER MICROSCOPES (MICROZOOM OR MITUTOYO) Please note: JMI has thousands of machines in stock and th ...
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Specifications Measurement Display Range ... 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution ... 5A (.5nm) Scan Length ... 50 microns to 30mm Scan time ... .4 to 65 secon ...
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STYLUS TYPE PROFILOMETER FOR MEASURING STEPS ON UP TO 6" WAFERS 360 DEGREE STAGE ROTATION 100 ANGSTROM TO 1310K ANGSTROM RANGE MAXIMUM VERTICAL RESOLUTION OF 1 ANGSTROM SERVICED BY FACTORY ...
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Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for reference. There may be multiple models of this item in stock. JMI will email a v ...
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4 POINT PROBE WITH DIGITAL R/O. Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for reference. There may be multiple models ...
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The FPP-5000 4-Point Probe (Figure 1 1) simplifies the measurement of resistive properties of semiconductor wafers and resistive films. The microprocessor based electronics permits direct ...
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Stylus Profilometer used in making accurate measurements on small vertical features ranging in height from 100-655000 angstroms (INCLUDES VIDEO CAMERA AND MONITOR) Please ...
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WENTWORTH MP 2000 (REBUILT) SEMIAUTOMATIC PROBE STATION 8" (300mm) CHUCK, 8X8" (300X300mm) TRAVEL, (NEW STEPPER MOTORS AND NEW JOYSTICK) SEMI-AUTOMATIC STEPPING. COVERED BY 1 YEA ...
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WENTWORTH 0037-1106 6" ANALYTICAL PROBE STATION MOTORIZED WITH JOYSTICK MITITOYO HIGH POWER ZOOM OPTICS (AUTOMATIC STEPPING) Please note: JMI has thousands of machines in stock and ...
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HIGH POWER MITUTOYO OPTICS MANUAL 6X6" MOVEMENT, 6" GOLD PLATED CHUCK. Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for r ...
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2" PROBER Please note: JMI has thousands of machines in stock and the photo of the item taken at our facility is for reference. There may be multiple models of this item in stock ...
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