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> Electron Microscope
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| 401947 | ||
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Make: Hitachi
Model: Hitachi S8840 Scanning Electro
Price e-mail
Hitachi S8840 SEM Consisting of: - Manufacturer: Hitachi - Model: S8840 - Wafer Size: 200mm - Hitachi S8840 CD SEM Mainframe - CD measuring size: 130-160nm, consistently - Versi ... | |
| 401946 | ||
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Make: Hitachi
Model: Hitachi FE-SEM model S-4700
Price e-mail
Condition: - Fully Refurbished by many years experienced technicians. - Guaranteed to meet or exceed OEM specifications - 3 MONTH warranty and specifications guarantee. - Installatio ... | |
| 401773 | ||
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Make: Jeol
Model: JSM-6401F
Price Best Offer
JEOL Scanning Electron Microscope. Excellent condition. Looking for best offer. Purchaser repsonsible for shipping arrangements and charges. | |
| 381778 | ||
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Make: Hitachi
Used Hitachi S-7000 Critical Dimension Scanning Electron Microscope (CD SEM) For Sale The Hitachi S-7000 CD SEM is an in-process evaluation tool for monitoring wafers during the during th ... | |
| 389990 | ||
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Make: FEI Company
Model: Phenom SEM
Price Contact Us
Phenom: Your personal electron microscope Phenom™ is a plug-and-play high-resolution desktop scanning electron microscope (SEM) with an optical (CCD) camera for never-lost navigation. ... | |
| 400755 | ||
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Make: JEOL/Nikon Instruments
Price $59,887.00
Brook Anco Web Special - JEOL / Nikon Instruments NeoScope JCM 5000 Portable SEM For Sale Affordable SEM for any Lab BENCHTOP SEM JCM 5000 WINS THE SELECT SCIENCE CHOICE AWARD The Ne ... | |
| 400546 | ||
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Make: Tescan
Model: Vega-II LMU
Price Upon Request
Tescan Vega-II LMU Variable Pressure SEM The Tescan Vega-II LMU is a state-of-the-art fully digital, computer- controlled variable pressure scanning electron microscope running under Micr ... | |
| 400543 | ||
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Make: LW Scientific
Model: M5 Labscope
Price $1,400.00
M5 Labscope, 5 position binocular nosepiece. 4x, 10x, 20x, 40x, 100x. Plan objectives installed. Darkfield/Phase Turret for M2 eries Microscope. Hard Carry Case for M2 Labscope. Ple ... | |
| 388017 | ||
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Make: JEOL
USED JEOL SEM MODEL # JWS 7800 SCANNING ELECTRON MICROSCOPE FOR SALE | |
| 400757 | ||
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Make: Nikon Instruments
Brook Anco Web Special - Nikon iNEXIV WarrantyX2 Promotion Nikon iNEXIV WarrantyX2 Promotion We are so confident of the reliability of the Nikon iNexiv and VMR3020/6555 Video Measuring S ... | |
| 381155 | ||
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Make: JEOL
Price Request Price Quote
Used JEOL JWS 7700 FE SEM Inspection & Metrology System for sale | |
| 400336 | ||
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Make: leica
Please contact me with availability and pricing | |
| 394145 | ||
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Make: FEI
Model: Fibermetric
Price Contact Us
Remote Assistant is Now Available for FEI’s Phenom Personal SEM New service enhancement speeds repair time and enhances tool availability of the Phenom. More Info About ... | |
| 387012 | ||
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Make: Hitachi
Used Hitachi S-8840 Scanning Electron Microscope For Sale Surface Inspection System For Sale Scanning Electron Microscope Hitachi S8840 CD SEM System. Production CD-SEM, 200mm capabl ... | |
| 399353 | ||
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Make: Zeiss
Model: EVO 50
Price $135k installed
Brand new in the crate 2008 Zeiss EVO 50HV SEM available for immediate delivery. Picture is a sister system, ready for demonstration. Click this link for product info: http://www.zeis ... | |
| 398697 | ||
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Make: JHT Instruments
Model: EXtend! XP
Bring your vintage XL-SEM or FIB microscope to current computing technology with the EXtend!-XP control system upgrade. This non-invasive upgrade brings Windows XP operation to your old ... | |
| 385940 | ||
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Make: Used Hitachi S-450
Model: Scanning Electron Microscope SEM
Used Hitachi S-450 Scanning Electron Microscope For Sale Easy to Maintain W Electron Source, X,Y, Z, Tilt & Theta Manual Stage Positioning, 100mm Dia. Sample when proper mount is used, ... | |
| 385925 | ||
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Make: Hitachi
Used Hitachi S-4500 SEM Cold Field Emmission Scanning Electron Microscope System For Sale DETAILS: Hitachi S-4500 SEM Cold Field Emmission SEM System consisting of: Performance: - S ... | |
| 385924 | ||
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Make: JEOL
Used JEOL JWS 7700 FE SEM Inspection & Metrology System For Sale DETAILS: JEOL JWS 7700 FE SEM Inspection & Metrology System consisting of: - JEOL JWS 7700 FE Main System - ... | |
| 385922 | ||
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Price Request Price Quote
Hitachi S-4500 SEM Cold Field Emmission SEM For Sale System consisting of:Performance:- Secondary electron image resolution: 1.5 nm at 15 kVA- Magnification: 20x – 500KX Electron Opti ... | |
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