Dual Inverted Selective Plane Illumination Microscopy
Generate 3d volumes with isotropic reso... Read More
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Microscopy is evolving toward greater functionality and capabilities. The Auriga FIB SEM platform from Carl Zeiss (Thornwood, NY) has been around for 11 years yet undergoes constant improvement. The system combines two distinct technologies: scanning electron microscopy (SEM) and focused ion beam (FIB). SEM’s capability of providing very high-resolution surface analysis is well known in the life sciences, materials, and semiconductor industries. SEM provides detail significantly beyond the diffraction limit of light microscopy, illuminating structures and events down to about 1nm.