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Electron Microscopes (EM) can provide image resolution at nanometer scale and permit imaging of complex substance and biological specimens. Scanning EM (SEM) can provide details on surface topology, whereas transmission EM (TEM) can capture atomic-level subsurface details through thinly sliced samples. When shopping, important considerations include: the type, size, and possible edge effects associated with the electron beam(s) and detectors. Purchasing decisions should include the system features and intended use, as many advanced features are now available with benchtop units -- making them particularly attractive for routine lab applications.

Showing 49 - 58 of 58 Items

Philips XL-30 ESEM
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Condition: Used

AMRAY 3300 Field Emission SEM
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Condition: Used

JEOL JSM-5900LV SEM
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Condition: Used

AMRAY 3200 ESEM
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Condition: Used

Hitachi S-3200H SEM
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Condition: Used

JEOL JSM-6300 SEM
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Condition: Used

ASPEX PSEM (Table Top)
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Condition: Used

AMRAY 1830 LaB6 SEM
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Condition: Used

Hitachi S-4200 Field Emission SEM
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Condition: Used

AMRAY 3600 Field Emission SEM
Price: Please Inquire

Condition: Used

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Tell LabX Sellers What You Need
Single Request, Multiple Offers