FEI Company DA300 - 300mm Dual Beam Scanning Electron Microscope
Categories:
• Electron MicroscopeManufacturer:
FEI CompanyModel: DA300/Expida 1285
Condition: Refurbished
Seller's Location: US
Description
Product Details
Seller Details
Listing SKU:
12841991Seller:
Innovative Semiconductor Solutions Inc.Warranty:
NoListing Date:
3rd December, 2020Last Updated:
3rd December, 2020Innovative Semiconductor Solutions Inc.
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Reduce mean time to resolution by up to 50%
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