Jeol JSM-6400F Scanning Microscope
Categories:
• Metrology and InspectionManufacturer:
JEOLModel: JSM-6400F
Condition: Not Specified
Seller: ClassOne Equipment
Seller's Location: Decatur, Georgia, UNITED STATES
Description
Product Details
Seller Details
Listing SKU:
LV41053185Seller:
ClassOne EquipmentWarranty:
NoListing Date:
27th July, 2020Last Updated:
28th April, 2021ClassOne Equipment
ClassOne specializes in selling high quality preowned equipment to the Semiconductor and Nanotechnology Industries including MEMS, Compound Semiconductors, Optoelectronics, Microelectronics, Science, and Technology. We focus on equipment used for wafer fabrication, metrology, assembly, and test. We strive to offer high quality equipment in excellent condition at the most competitive prices.
Location:
Decatur, Georgia, UNITED STATESMember Since:
24th August, 2006 (18 years ago)Current Listings:
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