X-ray powder diffractometer is the basic instrument on studying and indentifying the composition and structure of material. The applied field is showed as follow:

1. The atom arrangement of all kinds of compound in material could be determined. Some particular performance of material is related with atom arrangement.

2. The composition of material could be determined.

3. The ratio of all kinds compound could be determined.

4. The grain size, stress, texture, orientation and crystallizability.

XD-6 is with vertical multifunction goniometer (θs-θd) which is fit for the samples from normal powder and massive solid to very big and irregular solid and ropy liquid.

The type of vertical θs-θd goniometer means the sample holder fixed, the X-ray source and detector turned.

Key Features

◆ Vertical multifunction high precision goniometer: the minimal step size is 0.00025°. mechanical repeatability excels 0.0006°. θ-2θ goniometer could be selected, which is fit for normal powder and massive solid samples.

◆ Easy use and convenient maintenance: the sample is set horizontally because of the vertical goniometer. The sample is more conveniently put in. the sample stage is more conveniently cleaned up. The goniometer could not be polluted and the precision of goniometer is not influenced.

◆ High performance: the report of customer operating instrument for 8 months could be provided. The standard deviation of diffraction angle of αSiO2 is better than 0.0015°.

◆ Attention to the design of security mechanical: cabinets design and goniometer shutter using a chain institutions, has not yet specified the location of X-ray can not be opened, to prevent leakage of X-ray.

◆ A variety of option can extend system functionality: in accordance with the purpose of analysis, you can choose parallel light film annex, texture annex, high temperature annex, φ scanning and a variety of optional accessories.

Specifications

	XD-6	XD-3	XD-2
X-ray tube
Type	Cu target, NF model	Cu target, NF model	Cu target, NF model
Focus dimensions	1.0 x10 mm²	1.0 x10 mm²	1.0 x10 mm²
Maximum power	2 kW	2 kW	2 kW
X-ray generator
Maximum power	4 kW	3 kW	3 kW
X-ray tube voltage	15-60 kV	15-60 kV	15-60 kV
Tube voltage step width	1 kV	1 kV	1 kV
X-ray tube current	6-80 mA	6-50 mA	6-50 mA
Tube current stop width	1 mA	1 mA	1 mA
Tube voltage, tube current stability	≤0.01 % (Supply voltage fluctuations 10 %)	≤0.01 % (Supply voltage fluctuations 10 %)	≤0.01 % (Supply voltage fluctuations 10 %)
Alarm device	kV low, kV overtop, mA overload, water discharge, temperature	kV low, kV overtop, mA overload, water discharge, temperature	kV low, kV overtop, mA overload, water discharge, temperature
Ray power protection	0.35, 0.7, 1.0, 1.5, 2.0, 2.7 kW, six grade	0.35, 0.7, 1.0, 1.5, 2.0, 2.7 kW, six grade	0.35, 0.7, 1.0, 1.5, 2.0, 2.7 kW, six grade
Goniometer
Goniometer Type	Vertical (θ-θ)	Vertical (θ-2θ)	Vertical (θ-2θ)
Scanning radius	150-285 mm Continuously Adjustable	180 mm	180 mm
Scanning mode	θ_s-θ_d linkage or θ_s-θ_d single move	θ_s-θ_d linkage or θ_s-θ_d single move	θ-2θ linkage or θ-2θ single move
Measurement range	-30°-80° (θ_s) -30°-160° (θd)	-30°-80° (θ_s) -30°-160° (θd)	-182°-180° (θs) -30°-160° (θd)
Operation mode	Continuous scanning, Timing Step Scanning, Constant Step Scanning	Continuous scanning, Timing Step Scanning, Constant Step Scanning	Continuous scanning, Timing Step Scanning, Constant Step Scanning
Continuous scanning speed	0.125°-120°/min	0.125°-120°/min	0.125°-120°/min
Maximum Speed	1800 °/min	120 °/min	120 °/min
Angle repeatability	0.0005°	0.0006°	0.0006°
Measurement accuracy	0.001°	0.001°	0.001°
Minimum step size	0.0001°	0.00025°	0.00025°
Divergence slit (DS)	0.15°, 0.5°, 1°, 2°	0.15°, 0.5°, 1°, 2°	0.15°, 0.5°, 1°, 2°
Anti- scattering slit (SS)	0.5°, 1°, 2°	0.5°, 1°, 2°	0.5°, 1°, 2°
Receiving Slit (RS)	0.1, 0.15, 0.3, 0.45, 0.6, 1, 2 mm	0.1, 0.15, 0.3, 0.45, 0.6, 1, 2 mm	0.1, 0.15, 0.3, 0.45, 0.6, 1, 2 mm
Zero dedicated slit	0.02 mm	0.02 mm	0.02 mm
Detection- Counter	0.02 mm
The type of detector	Scintillator Counter	Scintillator Counter	Scintillator Counter
Crystal type	Nal	Nal	Nal
Pulse- height analyzer(PHA)	Output High Voltage 0-1000 V stability ≤0.01 % (8 h)	Output High Voltage 0-1000 V stability ≤0.01 % (8 h)	Output High Voltage 0-1000 V stability ≤0.01 % (8 h)
Machine cabinet
Cabinet size (in)	47 L x 32 W x 73 H	47 L x 32 W x 73 H	47 L x 32 W x 73 H
Machine weight (lb)	1,100	1,100	1,100
Observation window (in)	24 L x 16 W x 0.4, Lead glass	24 L x 16 W x 0.4, Lead glass	24 L x 16 W x 0.4, Lead glass
X-ray leakage	≤0.2 μ Sv/h(non deduction natural background)	≤0.2 μ Sv/h(non deduction natural background)	≤0.2 μ Sv/h(non deduction natural background)
Safety precautions	Door interlock protection (The door to a designated location, light gates open only to produce X-ray)	Door interlock protection (The door to a designated location, light gates open only to produce X-ray)	Door interlock protection (The door to a designated location, light gates open only to produce X-ray)
Filter- Monchromator
Ni filter	Corresponding Cu target	Corresponding Cu target	Corresponding Cu target
Graphite curved- crystal monochromator	Reflection efficiency η≥28 %	Reflection efficiency η≥28 %	Reflection efficiency η≥28 %
Integrated whole stability	≤0.3 %	≤0.3 %	≤0.3 %

PERSEE

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