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HP 5972

HP 5972

HP 5972 system uses electron impact (EI) ionization and is capable of performing full mass scans or selective ion monitoring (SIM).

Mass Spectrometer:

Full Scan:
Mass Range: 1.6-700 amu
Scan Speed: Up to 1800 amu/sec with 1 amu resolution 
Sensitivity: 10pg of Hexachlorobenzene yields a signal to noise of >10:1

Selective Ion Monitoring: 

Mass Range: Up to 50 groups of 30 masses/group 
Sensitivity: 200fg of Hexachlorobezene yields a signal to noise of >10:1

Hewlett Packard 5972

 

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