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JEOL JEM-ARM200F

JEOL JEM-ARM200F

The JEM-ARM200F atomic resolution analytical microscope has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the highest in the world for any commercial TEM. This new generation of transmission electron microscope features an electron probe that, after aberration correction, contains a current density level higher by an order of magnitude than conventional TEMs. With this probe finely focused, the ARM200F is capable of atomic level analysis, substantially reducing measurement time and improving throughput.

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