JEOL JSM-6010LA InTouchScope

The InTouchScope™ offers a whole new SEM experience with the familiar look and feel of today’s personal electronic media. The intuitive multi-touch screen interface puts all SEM “Apps” at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen. An analytical, low vacuum Scanning Electron Microscope (SEM), the InTouchScope features integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. Ease of use is a key feature of all JEOL SEMs, and the versatile InTouchScope has functions that users of all levels will appreciate.