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The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for imaging and analysis. JEOL's highest performance FE-SEM makes it possible to:   

  • Observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution   
  • Collect large area EBSD maps at low magnifications without distortion   
  • Perform low kV imaging and analysis of highly magnetic samples.   
  • Image thin, electron transparent samples with sub 0.8 nm resolution using an optional retractable STEM detector
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