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JEOL JSM-7800F
The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for imaging and analysis. JEOL's highest performance FE-SEM makes it possible to:
- Observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution
- Collect large area EBSD maps at low magnifications without distortion
- Perform low kV imaging and analysis of highly magnetic samples.
- Image thin, electron transparent samples with sub 0.8 nm resolution using an optional retractable STEM detector
New and used JEOL JSM-7800F's for sale on LabX. Purchase and get quotes on the products you need for your lab. Choose from a variety of vendors.
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