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JEOL JSM-IT300
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In addition to the high image quality observation due to the improvement of the illuminating system, the vacuum system and the signal processing system, the JSM-IT300 is a Scanning Electron Microscope, which can be operated with a high throughput by using touch panel operation and the high speed stage.
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JEOL JSM 5800 LV SEM SCANNING ELECTRON MICROSCOPE w/ BRUKER XFLASH 4010 EDS
Price: $8,000.00
Condition: Used
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