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JEOL JSM-IT300LV

JEOL JSM-IT300LV

The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs. This all-new design builds upon the award-winning platform of the InTouchScope™ analytical SEM with intuitive touch screen control, and supersedes the widely used high-performance analytical SEM, the JSM-6610LV.                

Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resolution, versatility, and operator interface. With a high resolution of 3.0nm at 30kV and unsurpassed low kV performance, the JSM-IT300LV delivers amazing clarity for imaging the finest structures.               

Versatility and high resolution across the magnification range of 5X - 300,000X are the hallmarks of the JEOL tungsten SEM family, and the JSM-IT300LV brings that capability to its highest level of performance today.

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