PerkinElmer 2000
The FTIR spectrometer analyses structures, bonding relations and sample compositions (ceramics, glasses, plastic materials, semi-conductors) in any combination and any condition (compact solid state, fractured surface, powder, fiber). The device identifies materials, impurities, detects functionalities or determines optical properties (refraction index, extinction coefficient) of films and compact solid states within the ultra-red spectroscopic range.
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