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Probe Station

Probe stations are essential tools for testing and evaluating microelectronic components and devices. They are used to make electrical measurements on devices under test, such as transistors, diodes, and integrated circuits. Probe stations consist of a platform for holding the device under test, probes for making electrical connections to the device, and various instruments for measuring and analyzing the device's electrical properties. The probe tips are positioned with high accuracy and precision to ensure that the correct electrical connections are made to the device under test. Probe stations are available in different configurations, ranging from benchtop systems for research and development to large-scale production systems for high-volume testing.

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