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Zeiss SEM

Zeiss SEM

Zeiss SEM or Scanning Electron Microscopes can scan a sample with a focused electron beam and deliver images with information about the samples’ topography and composition. 

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Versatile multipurpose SEM  
The EVO® MA 10 will be the SEM of choice for many users in Materials Analysis. Imaging non conductors is now central to nanotechnology and the “ high vacuum only” conventional SEM has been superseded. With a large motorised 5 axis stage, variable pressure capability as standard, and easy to use SmartSEM software, the EVO® MA 10 offers a perfect imaging solution to the modern Materials Analysis SEM suite.