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Phenom ParticleX TC Desktop SEM
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The Phenom ParticleX Desktop SEM is a multi-purpose solution designed for quality control and cleanliness at the microscale. It gives you the ability to carry out speedy analysis, verification and classification of materials, supporting your production with fast, accurate and trusted data. The system is automated and offers multiple sample analysis, making testing and classification up to 10 times faster.
• Designed to gauge automotive parts cleanliness
• Automatically monitor size, shape, chemistry and classification of particulate extracted from fluid systems
• Standard reports compliant with VDA 19 / ISO 16232