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Electron Microscopes (EM) can provide image resolution at nanometer scale and permit imaging of complex substance and biological specimens. Scanning EM (SEM) can provide details on surface topology, whereas transmission EM (TEM) can capture atomic-level subsurface details through thinly sliced samples. When shopping, important considerations include: the type, size, and possible edge effects associated with the electron beam(s) and detectors. Purchasing decisions should include the system features and intended use, as many advanced features are now available with benchtop units -- making them particularly attractive for routine lab applications.

Showing 1 - 24 of 36 Items

Win10 JEOL 6400 SEM Powered by SEMView8000
Price: Please Inquire

Condition: Refurbished

FEI Helios Nanolab 400
Price: Please Inquire

Condition: Refurbished

Hitachi S-2400 SEM with 4 Pi X-Ray and Chiller
Price: $15,000.00

Condition: For Parts/Not Working

JOEL JSM 6400
Price: Please Inquire

Condition: For Parts/Not Working

JEOL JEM-2010 LaB6 TEM
Price: $95,000.00

Condition: Used

New Micro XRF Analytical Microscope
Price: Please Inquire

Condition: New

Agilent 6460 Triple Quad LC/MS
Price: Please Inquire

Condition: Used

JEOL JSM 5200 SEM Scanning Electron Microscope Nice
Price: Please Inquire

Condition: Used

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Tell LabX Sellers What You Need
Single Request, Multiple Offers