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Electron Microscope Listings
Shop NewShop Pre-OwnedSell Your ProductElectron Microscopes (EM) can provide image resolution at nanometer scale and permit imaging of complex substance and biological specimens. Scanning EM (SEM) can provide details on surface topology, whereas transmission EM (TEM) can capture atomic-level subsurface details through thinly sliced samples. When shopping, important considerations include: the type, size, and possible edge effects associated with the electron beam(s) and detectors. Purchasing decisions should include the system features and intended use, as many advanced features are now available with benchtop units -- making them particularly attractive for routine lab applications.
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Showing 1 - 24 of 71 Items
Philips EM-430 Transmission Electron Microscope, CU Boulder Surplus
Price: Please Inquire
Condition: Used
Gas-Injection System (GIS) for delivery deposition precursors in Focused Ion Beam (FIB) and dual-beam FIB/SEM
Price: $65,000.00
Condition: New
Philips Reflection Diffraction Sample Holder Type PW 6593/00 for EM 400 series CM series and Tecnai
Price: $7,500.00
Condition: Refurbished
Philips Tensile Stage Sample Holder Type PW 6552/01 for 400 series, CM series, and Tecnai
Price: $12,000.00
Condition: Refurbished