Electron Microscopes (EM) can provide image resolution at nanometer scale and permit imaging of complex substance and biological specimens. Scanning EM (SEM) can provide details on surface topology, whereas transmission EM (TEM) can capture atomic-level subsurface details through thinly sliced samples. When shopping, important considerations include: the type, size, and possible edge effects associated with the electron beam(s) and detectors. Purchasing decisions should include the system features and intended use, as many advanced features are now available with benchtop units -- making them particularly attractive for routine lab applications.
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Refurbished FEI P/N 1301684 consumable suppressor for CLM ExSolve Certus Strata Helios Scios FIB400 V600 G4 Phoenix Focused Ion Beam
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