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Electron Microscopes (EM) can provide image resolution at nanometer scale and permit imaging of complex substance and biological specimens. Scanning EM (SEM) can provide details on surface topology, whereas transmission EM (TEM) can capture atomic-level subsurface details through thinly sliced samples. When shopping, important considerations include: the type, size, and possible edge effects associated with the electron beam(s) and detectors. Purchasing decisions should include the system features and intended use, as many advanced features are now available with benchtop units -- making them particularly attractive for routine lab applications.

Showing 1 - 24 of 46 Items

Win10 JEOL 6400 Refurbished SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 Hitachi S-3200 Refurbished SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 FEI/Philips XL30 Refurbished SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 FEI Quanta400 Refurbished SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 LEO 1450VP Refurbished SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 JEOL 6390LV Refurbished SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 JEOL 5900LV Refurbished SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 AMRAY 3200LV Refurbished SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 AMRAY 1830 Refurbished SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 LEO 1560 Refurbished FE SEM - Powered by SEMView8000
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Condition: Refurbished

Win10 AMRAY 3300 Refurbished FE SEM - Powered by SEMView8000
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Condition: Refurbished

SEM Accessory - STS IR Chamberscope
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Condition: New

SEM Accessory - STS F1 Motorized BSE Detector
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Condition: New

SEM Accessory - STS Silicon Drift Detector
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Condition: New

New XGT-9000 Micro XRF Analytical Microscope
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Condition: New

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Tell LabX Sellers What You Need
Single Request, Multiple Offers