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Electron Microscopes (EM) can provide image resolution at nanometer scale and permit imaging of complex substance and biological specimens. Scanning EM (SEM) can provide details on surface topology, whereas transmission EM (TEM) can capture atomic-level subsurface details through thinly sliced samples. When shopping, important considerations include: the type, size, and possible edge effects associated with the electron beam(s) and detectors. Purchasing decisions should include the system features and intended use, as many advanced features are now available with benchtop units -- making them particularly attractive for routine lab applications.

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SEM Accessory - STS IR Chamberscope
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SEM Accessory - STS F1 Motorized BSE Detector
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SEM Accessory - STS Silicon Drift Detector
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New XGT-9000 Micro XRF Analytical Microscope
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LVEM5 Benchtop Electron Microscope
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New! Magellan Extreme Resolution SEM
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Condition: New

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Tell LabX Sellers What You Need
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